Focus Solutions
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- Condensatori - capacità, carica, corrente bassa, tensione di rottura
- Modeling di dispositivi - acquisizione di dati ed estrazione di parametri
- Diodi - tensione di rottura elevata, curve I-V
- Dispositivi nanoelettronici - caratterizzazione C-V
- Dispositivi nanoelettronici - misurazioni di basse resistenze
- Dispositivi nanoelettronici - curve I-V elettroniche molecolari e nanoelettroniche
- Resistor - ampio campo dinamico, elevata precisione di collaudo, misurazioni veloci
- Transistor - misurazioni I-V, C-V
- Condensatori - capacità, carica, corrente bassa, tensione di rottura
- Products
- Model 2410 High-Voltage SourceMeter w/ Measurements up to 1100V and 1A, 20W Power Output
- Model 4200-SCS Semiconductor Characterization System
- System 82-WIN Simultaneous C-V System for Windows
- Modeling di dispositivi - acquisizione di dati ed estrazione di parametri
- Products
- Model 4200-SCS Semiconductor Characterization System
- Diodi - tensione di rottura elevata, curve I-V
- Products
- Model 2400 General-Purpose SourceMeter w/ Measurements up to 200V and 1A, 20W Power Output
- Model 2410 High-Voltage SourceMeter w/ Measurements up to 1100V and 1A, 20W Power Output
- Model 2420 High-Current SourceMeter w/ Measurements up to 60V and 3A, 60W Power Output
- Model 2425 100W SourceMeter w/ Measurements up to 100V and 3A
- Model 2430 1kW Pulse Mode SourceMeter w/ Measurements up to 100V and 10A
- Model 2440 5A SourceMeter w/ Measurements up to 40V and 5A, 50W Power Output
- Model 4200-SCS Semiconductor Characterization System
- Model 6430 Sub-Femtoamp Remote SourceMeter
- Dispositivi nanoelettronici - caratterizzazione C-V
- Products
- Dispositivi nanoelettronici - misurazioni di basse resistenze
- Products
- Model 2001 High-Performance, 7-1/2-Digit DMM w/ 8k Memory
- Model 2002 High-Performance, 8-1/2-Digit DMM w/ 8k Memory
- Model 2010 7-1/2-Digit, Low-Noise, Autoranging DMM
- Model 2400 General-Purpose SourceMeter w/ Measurements up to 200V and 1A, 20W Power Output
- Dispositivi nanoelettronici - curve I-V elettroniche molecolari e nanoelettroniche
- Products
- Model 2400 General-Purpose SourceMeter w/ Measurements up to 200V and 1A, 20W Power Output
- Model 4200-SCS Semiconductor Characterization System
- Model 6430 Sub-Femtoamp Remote SourceMeter
- Resistor - ampio campo dinamico, elevata precisione di collaudo, misurazioni veloci
- Products
- Model 2000 6-1/2-Digit DMM
- Model 2010 7-1/2-Digit, Low-Noise, Autoranging DMM
- Model 2400 General-Purpose SourceMeter w/ Measurements up to 200V and 1A, 20W Power Output
- Model 2410 High-Voltage SourceMeter w/ Measurements up to 1100V and 1A, 20W Power Output
- Model 2420 High-Current SourceMeter w/ Measurements up to 60V and 3A, 60W Power Output
- Model 2425 100W SourceMeter w/ Measurements up to 100V and 3A
- Model 2430 1kW Pulse Mode SourceMeter w/ Measurements up to 100V and 10A
- Model 2440 5A SourceMeter w/ Measurements up to 40V and 5A, 50W Power Output
- Model 4200-SCS Semiconductor Characterization System
- Model 6430 Sub-Femtoamp Remote SourceMeter
- Transistor - misurazioni I-V, C-V
- Products
- Model 2410 High-Voltage SourceMeter w/ Measurements up to 1100V and 1A, 20W Power Output
- Model 2420 High-Current SourceMeter w/ Measurements up to 60V and 3A, 60W Power Output
- Model 4200-SCS Semiconductor Characterization System
- System 82-WIN Simultaneous C-V System for Windows