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- Approvazione dei wafer di fine linea - transistor (Vt), diodi, capacità, resistor, ritardo di gate
- Qualificazione delle apparecchiature - densità dei difetti
- Porta/polisilicio - MOSCAP GOI, ECD, Vt
- Metallo-2 - controllo contatti, elettromigrazione, EWR
- Nuove tecnologie - RF/DC, SOC, FeRAM, MRAMS, LCD-TEG
- Approvazione dei wafer di fine linea - transistor (Vt), diodi, capacità, resistor, ritardo di gate
- Products
- Model 4200-SCS Semiconductor Characterization System
- S400DC/RF Single-insertion RF and DC Test Solution
- Qualificazione delle apparecchiature - densità dei difetti
- Products
- Model 4200-SCS Semiconductor Characterization System
- S400DC/RF Single-insertion RF and DC Test Solution
- Porta/polisilicio - MOSCAP GOI, ECD, Vt
- Products
- Model 2400 General-Purpose SourceMeter w/ Measurements up to 200V and 1A, 20W Power Output
- Model 4200-SCS Semiconductor Characterization System
- S600 Series Parametric Test Systems
- S400DC/RF Single-insertion RF and DC Test Solution
- Metallo-2 - controllo contatti, elettromigrazione, EWR
- Products
- Model 4200-SCS Semiconductor Characterization System
- S400DC/RF Single-insertion RF and DC Test Solution
- Nuove tecnologie - RF/DC, SOC, FeRAM, MRAMS, LCD-TEG
- Products
- Model 4200-SCS Semiconductor Characterization System
- S600 Series Parametric Test Systems
- S400DC/RF Single-insertion RF and DC Test Solution