Test di affidabilità

• Products
• Automated Characterization Suite (ACS) Test Systems
• ACS for Wafer Level Reliability (WLR)
• Model 4200-SCS Semiconductor Characterization System - Leading-Edge Pulse Capability Integrated with Precision DC Measurement for the 65nm Node and Beyond
• Model 2612A Dual-channel System SourceMeter Instrument (200V, 10A Pulse)