Keithley's new Low Level Measurements Handbook contains the information you need to make the most accurate, sensitive measurements on today's small devices, plus proper use and configuration of nanovoltmeters, picoammeters, electrometers, and high and low resistance sources. There's also an instrument selection guide, a glossary, a troubleshooting guide, and a section about safety considerations.
Overcoming the Measurement Challenges of Advanced Semiconductor Technologies: DC, Pulsed, and RF—From Modeling to Manufacturing is a 140-page tutorial handbook that draws from the collective experience of Keithley’s parametric test and device characterization experts and the company’s customers.
It provides objective recommendations on designing test circuits, software programs, and common test and automation systems. This 220+-page reference is divided in eight sections: a data acquisition and measurement overview; computer buses, protocols, and hardware; software overview; basic component theory; basic analog and digital I/O; temperature measurement, strain measurement, related topics of interest, and application examples. Appendices include selector guides for plug-in boards, USB modules, PXI systems, and external data acquisition instruments; a glossary; and a short section on test and measurement safety considerations.
Keithley’s Nanotechnology Measurement Handbook: A Guide to Electrical Measurements for Nanoscience Applications offers practical assistance in making precision low level DC and pulse measurements on nanomaterials and devices. It is useful both as a reference and as an aid to understanding low level phenomena observed in the lab. It provides an overview of the theoretical and practical considerations involved in measuring low currents, high resistances, low voltages, and low resistances.
